Reliability Models for Double Chipkill Detect/Correct Memory Systems

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Provided by: Los Alamos National Laboratory
Topic: Storage
Format: PDF
Chipkill correct is an advanced type of error correction used in memory subsystems. Existing analytical approaches for modeling the reliability of memory subsystems with chipkill correct are limited to those with chipkill correct solutions that can only guarantee correction of errors in a single DRAM device. However, chipkill correct solutions capable of guaranteeing the detection and even correction of errors in up to two DRAM devices have become common in existing HPC systems. Analytical reliability models are needed for such memory subsystems.
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