Resolving the Memory Bottleneck for Single Supply Near-Threshold Computing

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Provided by: EPFL
Topic: Hardware
Format: PDF
The increase in integrated circuit complexity and continued scaling of process technology has led to a tremendous wealth of new applications. In this paper, the authors focus on a review of state-of-the-art memory designs and new design methods for Near-Threshold Computing (NTC). In particular, it presents new ways to design reliable low-voltage NTC memories cost-effectively by reusing available cell libraries, or by adding a digital wrapper around existing commercially available memories. The approach is based on modeling at system level supported by silicon measurement on a test chip in a 40nm low-power processing technology.
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