Selective Compression Techniques Using Variable-to-Fixed and Fixed-to-Variable Codes

Provided by: International Journal of Computer Applications
Topic: Hardware
Format: PDF
System-on-Chip (SoC) revolution challenges both the fields of designing and testing, as it nowadays integrates multiple cores on a single piece of silicon to bring about a wide range of functionality on a single die. With the number of transistors increasing rapidly, chips emerge with billions of transistors, and this number continues to grow over the years. Testing devices with this number of transistors, quickly, efficiently and thoroughly is a very challenging task and requires proper strategies and systematic test approaches.

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