SEU-Tolerant QDI Circuits

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Provided by: National Science Foundation
Topic: Hardware
Format: PDF
When a high-energy particle hits the silicon substrate of a CMOS (Complementary Metal-Oxide-Semiconductor) chip, it can generate electron-hole pairs and form a short-duration current that can change the output of a gate. This paper addresses the issue of Single-Event Upset (SEU) in Quasi Delay-Insensitive (QDI) asynchronous circuits. The authors show that an SEU can cause abnormal computations in QDI circuits beside deadlock, and they propose a general method to make QDI circuits SEU-tolerant. They present simplified SEU-tolerant buffer implementations for CMOS technology. Finally, they present a case study of a one-bit comparator and show SPICE-simulation results.
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