Slow Write Driver Faults in 65nm SRAM Technology: Analysis and March Test Solution

Provided by: edaa
Topic: Storage
Format: PDF
In this paper the authors present an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) that may affect SRAM write drivers in 65nm technology. This type of fault is the consequence of resistive-open defects in the control part of the write driver. It involves an erroneous write operation when the same write driver performs two successive write operations with opposite data values. In this paper, they present the SWDF electrical phenomena and their consequences on the SRAM functioning.

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