International Journal of Engineering and Technology
In the present time, great emphasis has been given to the design of low-power and high performance memory circuits. As an SRAM is a critical component in both high-performance processors and hand-held portable devices. So the ever-increasing levels of on-chip integration of SRAM, offers serious design challenges in terms of power requirement and cell stability. There is a significant increase in the sub-threshold leakage due to its exponential relation to the threshold voltage, and gate leakage due to the reducing gate-oxide thickness.