Test Pattern Generation by Using Accumulator

Provided by: International Journal of Engineering Research and Development (IJERD) Topic: Hardware Date Added: Apr 2014 Format: PDF
Weighted pseudorandom Built-In Self-Test (BIST) schemes have been utilized in order to drive down the number of vectors to achieve complete fault coverage in BIST applications. Weighted sets comprising three weights, namely 0, 1, and 0.5 have been successfully utilized so far for test pattern generation, since they result in both low testing time and low consumed power. In this paper, an accumulator-based 3-weight test pattern generation scheme is presented; the proposed scheme generates set of patterns with weights 0, 0.5, and 1.

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