Provided by: Linkoping University
In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measurement and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, the authors detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types.