Testing Embedded Memories: A Survey

Provided by: Springer Healthcare
Topic: Hardware
Format: PDF
According to the international technology roadmap for semiconductors, embedded memories will continue to dominate the increasing System-on-Chips (SoCs) content in the future, approaching 90% in some cases. Therefore, the memory yield and quality will have a dramatic impact on the overall SoC cost and outgoing product quality. Meeting a high memory yield and quality requires understanding memory designs, modeling their faulty behaviors in appropriate and accurate way, designing adequate tests and diagnosis strategies as well as efficient design-for-testability and Built-In-Self-Test (BIST) schemes.

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