Towards Scalable System-Level Reliability Analysis

Provided by: Association for Computing Machinery
Topic: Hardware
Format: PDF
State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems: the BDDs exhaust available memory during their construction and/or the final size of the BDDs is, sometimes up to several orders of magnitude, larger than the available memory. The contribution of this paper is twofold: a partitioning-based early quantification technique is presented that aims to keep the size of the BDDs during construction at minimum. A SAT-assisted simulation approach aims to deliver approximated results when exact analysis techniques fail because the final BDDs exhaust available memory.

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