TRAM: A Tool for Temperature and Reliability Aware Memory Design

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Provided by: edaa
Topic: Hardware
Format: PDF
Process scaling has enabled systems to offer much higher computational power and performance at the expense of rising power consumption and operating temperatures. Higher operating temperatures have many adverse effects on the design such as: need for expensive cooling mechanisms, increased leakage power, reduced interconnect lifetime, accelerated electromigration, increased cell delay, and increased probability of errors in memories and logic. In this paper, the authors focus on the effect of temperature on reliable operation of memories.
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