Vulnerability Analysis of L2 Cache Elements to Single Event Upsets

Provided by: European Design and Automation Association
Topic: Storage
Format: PDF
Memory elements are the most vulnerable system component to soft errors. Since memory elements in cache arrays consume a large fraction of the die in modern microprocessors, the probability of particle strikes in these elements is high and can significantly impact overall processor reliability. Previous paper has developed effective metrics to accurately measure the vulnerability of cache memory elements. Based on these metrics, the authors have developed a reliability-performance evaluation framework, which has been built upon the simplescalar simulator.

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