In this paper, the authors describe the implementation of testing of CMOS (Complementary Metal-Oxide-Semiconductor) digital integrated circuits for both functional and delay fault testing using reconfigurable field programmable gate array, XC3S500E. This FPGA (Field-Programmable Gate Array) is interfaced with LCD (Liquid-Crystal Display) and hex keypad, has created a very comfortable environment for CMOS digital integrated circuits testing. Tester has generated and applied test vectors for functional and delay fault testing for particular CMOS ICs and check responses with according to particular gate response.