Testing of embedded System is a great challenge for software testers. Testing of embedded systems is most sophisticated and time consuming task because of its different infrastructure, organizations and techniques used for its development. Testing of application specific embedded system is not similar to testing of another embedded system. This paper gives a new artificial intelligent approach for testing of various embedded systems. It focuses on three different aspects. First is the efficient use of an artificial intelligence approach to test the embedded system. Second is the development of one universal platform for testing. Third is development of safety critical character generator device.