In this paper, the authors introduce a Test Pattern Generator (TPG) in order to use in Built-In Self-Test (BIST). MSIC TPG generates Multiple Single Input Change (MSIC) vectors in a pattern, i.e., each vector applied to a scan chain is an SIC vector. With the help of reconfigurable Johnson counter and a scalable SIC counter it's easy to generate a class of minimum transition sequences. The proposed TPG is flexible to test-per-scan schemes. A theory is developed to represent and analyze the sequences and to extract a class of MSIC sequences.